Electronics and Electrical Engineering
SIMSCAN-E Smart Wireless Handheld 3D Scanner
The SIMSCAN-E wireless handheld 3D scanner, with its lightweight body and cutting-edge wireless scanning technology, ushers in a new era of lightweight, portable, and wireless scanning freedom. Equipped with a powerful edge computing engine and a high-definition industrial camera module, it boasts a measurement rate of up to 6.3 million measurements per second, rapidly capturing 3D data with metrology-grade accuracy. Featuring high-speed, fine, and deep-hole scanning modes, its leading performance allows it to easily handle measurements in confined spaces or complex structures.
KSCAN-Magic series composite 3D laser scanner
The KSCAN-MAGIC series are infrared + blue laser metrology-grade composite 3D scanners, standard with five working modes: infrared parallel laser large-area scanning, blue cross laser high-speed scanning, blue parallel laser fine scanning, single-beam blue laser deep-hole scanning, built-in global photogrammetry system.
ATOS Core optical scanning system
The ATOS Core is specialized for the 3D measurement of small components with dimensions under 500 millimeters. From simple 3D scans to fully automated measuring and inspection processes, its measurement head provides fundamental support for the implementation of various tasks. The ATOS Core is particularly suitable for the 3D measurement of medium and small objects, such as ceramic cores, castings or plastic parts. To measure large objects up to several meters in length using an efficient workflow, the ATOS Core can be quickly and easily combined with GOM's TRITOP optical 3D coordinate measuring device for digital photogrammetry.
ATOS Q 3D scanning measurement instrument laser profile scanner
3D scanning solution for complex measurement and inspection tasks Reliable, versatile, compact, mobile, and highly precise: the ATOS Q is ideal for use in your workshop. It is designed as a flexible 3D scanner that perfectly solves complex measurement and inspection tasks, meeting the high-end metrology needs of numerous industrial sectors. Combined with GOM Inspect, it forms an optical 3D measurement system that inherits the excellent genes of ATOS, is fast, compact, and easy to operate.
The CP series step profiler is an ultra-precise contact-type micro-profile measuring instrument, mainly used for measuring micro-morphology parameters such as step height, film thickness, and surface roughness. During measurement, a 2μm radius diamond stylus scans the sample surface while moving on an ultra-precision displacement stage. The vertical displacement of the stylus is converted into an electrical signal matching the feature size and finally into a digital point cloud signal. The data point cloud signal is displayed in the analysis software, and different analysis tools are used to obtain data related to surface quality, such as step height or roughness.
SJ5100-Prec300 high-precision grating length measuring instrument
The SJ5100 series high-precision grating length measuring machine adopts imported high-precision grating measuring system, high-precision grinding linear guide rail, high-precision temperature compensation system, two-way constant force system, and high-performance computer control system technology to achieve high-precision measurement of various length parameters. The high-precision grinding guide rail ensures the high stability and ultra-high linearity of the measuring head movement. An imported high-precision grating measuring system records the length direction coordinates. The computer synthesizes the data after correcting the grating data with the feedback data from the force measuring device and temperature sensor and the Abbe error data (due to the high linearity of the guide rail, the instrument error caused by Abbe correction is minimal). Relevant length parameters are calculated based on the relevant definitions and formulas of the measured part parameters. The operator installs the workpiece, selects the standard of the workpiece and inputs the specifications of the workpiece on the detection software, moves the head to contact the workpiece, adjusts the five-axis worktable to find the inflection point, completes sampling to obtain the measurement data. The system can display the measurement results in real time, automatically calculate the various parameters of the workpiece (such as automatically calculating the pitch diameter of the thread gauge), and make a pass/fail judgment of the various parameters of the workpiece based on the standard database built into the system. The entire measurement process takes no more than 3 minutes, and a result and record report is automatically generated at the end. The standard system software is a simplified Chinese operating system (English, Russian, and other languages can be selected), and the operation is convenient and simple.
SuperView W1 Series Optical 3D Surface Profiler
Optical 3D surface profilometers are instruments used for sub-nanometer level measurement of the surface of various precision devices and materials. Based on the principle of white light interferometry, combined with a precision Z-axis scanning module and 3D modeling algorithms, it performs non-contact scanning of the device surface and establishes a 3D image of the surface. The system software processes and analyzes the 3D image of the device surface, obtaining 2D and 3D parameters that reflect the surface quality of the device, thereby achieving optical detection of the 3D measurement of the device surface topography. SuperView W1 series optical 3D surface profilometers are widely used in semiconductor manufacturing and packaging process detection, 3C electronic glass screens and their precision accessories, optical processing, micro-nano materials and manufacturing, automotive parts, MEMS devices and other ultra-precision processing industries, as well as aerospace, national defense, military industry, and scientific research institutes. It can measure various object surfaces from ultra-smooth to rough, low reflectivity to high reflectivity, roughness, flatness, microscopic geometric profile, curvature, etc., of workpieces from nanometer to micrometer level, providing more than 300 2D and 3D parameters based on four domestic and international standards including ISO/ASME/EUR/GBT as evaluation standards.
20-megapixel CMOS imaging for clearer images, 360° turntable rotation for more comprehensive measurements
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VJ series 3D profile measuring instrument
The VJ series 3D profile measuring instrument, equipped with a high-precision line laser probe and combined with a high-precision image analysis algorithm, achieves non-contact scanning 3D profile imaging for fast and accurate dimensional measurement. In CNC mode, simply press the start button, and the instrument can automatically locate the measurement object, match the template, perform measurement evaluation, and generate reports according to the shape of the workpiece, truly achieving one-button fast and accurate measurement.