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Dimension measurement

CP Series Step Machine


The CP series step profiler is an ultra-precise contact-type micro-profile measuring instrument, mainly used for measuring micro-morphology parameters such as step height, film thickness, and surface roughness. During measurement, a 2μm radius diamond stylus scans the sample surface while moving on an ultra-precision displacement stage. The vertical displacement of the stylus is converted into an electrical signal matching the feature size and finally into a digital point cloud signal. The data point cloud signal is displayed in the analysis software, and different analysis tools are used to obtain data related to surface quality, such as step height or roughness.

SJ5100-Prec300 high-precision grating length measuring instrument


The SJ5100 series high-precision grating length measuring machine adopts imported high-precision grating measuring system, high-precision grinding linear guide rail, high-precision temperature compensation system, two-way constant force system, and high-performance computer control system technology to achieve high-precision measurement of various length parameters. The high-precision grinding guide rail ensures the high stability and ultra-high linearity of the measuring head movement. An imported high-precision grating measuring system records the length direction coordinates. The computer synthesizes the data after correcting the grating data with the feedback data from the force measuring device and temperature sensor and the Abbe error data (due to the high linearity of the guide rail, the instrument error caused by Abbe correction is minimal). Relevant length parameters are calculated based on the relevant definitions and formulas of the measured part parameters. The operator installs the workpiece, selects the standard of the workpiece and inputs the specifications of the workpiece on the detection software, moves the head to contact the workpiece, adjusts the five-axis worktable to find the inflection point, completes sampling to obtain the measurement data. The system can display the measurement results in real time, automatically calculate the various parameters of the workpiece (such as automatically calculating the pitch diameter of the thread gauge), and make a pass/fail judgment of the various parameters of the workpiece based on the standard database built into the system. The entire measurement process takes no more than 3 minutes, and a result and record report is automatically generated at the end. The standard system software is a simplified Chinese operating system (English, Russian, and other languages can be selected), and the operation is convenient and simple.

SuperView W1 Series Optical 3D Surface Profiler


Optical 3D surface profilometers are instruments used for sub-nanometer level measurement of the surface of various precision devices and materials. Based on the principle of white light interferometry, combined with a precision Z-axis scanning module and 3D modeling algorithms, it performs non-contact scanning of the device surface and establishes a 3D image of the surface. The system software processes and analyzes the 3D image of the device surface, obtaining 2D and 3D parameters that reflect the surface quality of the device, thereby achieving optical detection of the 3D measurement of the device surface topography. SuperView W1 series optical 3D surface profilometers are widely used in semiconductor manufacturing and packaging process detection, 3C electronic glass screens and their precision accessories, optical processing, micro-nano materials and manufacturing, automotive parts, MEMS devices and other ultra-precision processing industries, as well as aerospace, national defense, military industry, and scientific research institutes. It can measure various object surfaces from ultra-smooth to rough, low reflectivity to high reflectivity, roughness, flatness, microscopic geometric profile, curvature, etc., of workpieces from nanometer to micrometer level, providing more than 300 2D and 3D parameters based on four domestic and international standards including ISO/ASME/EUR/GBT as evaluation standards.

VJ series 3D profile measuring instrument


The VJ series 3D profile measuring instrument, equipped with a high-precision line laser probe and combined with a high-precision image analysis algorithm, achieves non-contact scanning 3D profile imaging for fast and accurate dimensional measurement. In CNC mode, simply press the start button, and the instrument can automatically locate the measurement object, match the template, perform measurement evaluation, and generate reports according to the shape of the workpiece, truly achieving one-button fast and accurate measurement.

SuperView W5 five-axis fully automatic optical 3D surface profiler


SuperViewW5 is mainly used for high-precision measurement of surface roughness and waviness of irregular workpieces. With the cooperation of a five-axis displacement stage (XYZ displacement axes, swing rotary platform) and tooling fixture, and based on the provided workpiece model, it achieves rapid positioning. It can automatically adjust the displacement of the five-axis stage to the specified coordinate position input in the software, allowing the white light measuring head to quickly move to the specified coordinate position on the workpiece for measurement and data acquisition. Subsequently, the software analyzes the data to obtain 2D/3D data on roughness and waviness.

SuperView WX100 white light interferometry probe


Measurement Function: Enables high-precision Z-axis scanning of the sample surface to obtain 3D images. Analysis Function: Enables acquisition of 2D and 3D data regarding surface quality, such as roughness and micro-nano level profile dimensions. Programming Function: Supports pre-configured data processing and analysis tool steps, enabling one-click completion of the entire measurement and analysis process. Batch Analysis: Allows customization of data processing and analysis templates based on required parameters, enabling one-click batch analysis of data with the same type of parameters.

MX 3200 Microscopic Dimension Measurement Instrument


The MX3200 Microscopic Dimension Measurement Instrument combines microscopic imaging with traditional image measurement, enabling the measurement of a wide range of tiny features. Equipped with an electric turret, it can automatically switch to different magnifications to detect various precision microscopic two-dimensional dimensional features. It offers rich dimensional measurement functions, enabling the measurement of various two-dimensional points, lines, circles, etc., and the evaluation of form and position tolerances. The MX3200 Microscopic Dimension Measurement Instrument can be used in the fields of precision machinery, optical communication devices, precision molds, magnetic materials, precision stamping, precision mobile phone components, medical devices, watches, tools, metrology and testing, etc.

GTS series laser trackers


Integrated Control Host Design A powerful CPU processing capability and compact control host are built into the laser tracking head. The integrated design of the host significantly reduces the number of connecting cables and carrying cases, facilitating quick on-site installation. Automatic Target Ball Locking Technology The target locking camera automatically searches for the target ball within a small range when the light is interrupted, automatically locking onto the target ball without any manual operation, thus improving measurement efficiency. HiADM Ranging Technology The fusion of laser absolute distance measurement (ADM) and laser interference distance measurement (IFM) technologies (HIADM) combines the high dynamic speed of laser interferometry with the functionality of laser absolute distance measurement, ensuring superior measurement accuracy and enabling light obstruction recovery. Integrated Meteorological Station The integrated environmental meteorological station automatically monitors and updates environmental meteorological parameters, providing real-time compensation for the effects of temperature, air pressure, and humidity on the refractive index of air for laser measurements, ensuring accuracy. MultiComm Communication The device can communicate with the computer via multiple methods such as hardware triggering, wired networks, or wireless WIFI, facilitating use in secure workshops and achieving a maximum measurement data output speed of 1000 points/second. Portable Transportation The laser tracking head with its integrated host design, and integrated accessory transport case, results in a small and lightweight overall transport system, making it easy to transport between different work locations. Sealed Protective Design IP54 protection rating ensures the host is protected from dust and other pollutants, offering strong environmental adaptability. Stable Tripod A stable and convenient tripod and chassis design ensure stable ground measurement conditions. The ingenious lifting mechanism is easy to operate, and the stable three-legged support system prevents accuracy loss due to environmental vibrations.

SJ6000 series laser interferometer


Laser interferometers use light waves as carriers. Their light wave wavelengths can be used to directly define meters and can be traced back to national standards. They are recognized as high-precision, high-sensitivity measuring instruments and are widely used in high-end manufacturing. The SJ6000 laser interferometer has the advantages of high measurement accuracy, large measurement range, fast measurement speed, and high resolution at the highest measurement speed. Combined with different optical lens groups, it can achieve high-precision measurement of linear length, angle, straightness, verticality, parallelism, flatness, and other geometric parameters. With the cooperation of the SJ6000 laser interferometer dynamic measurement software, dynamic measurement and performance testing of linearity, angle, and straightness can be realized, and displacement analysis, velocity analysis, acceleration analysis, and FFT analysis can be performed, such as dynamic characteristic analysis of screw rod guides, vibration analysis, and response characteristic analysis of drive systems.

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