Electronics and Electrical Engineering
SuperView W5 five-axis fully automatic optical 3D surface profiler
SuperViewW5 is mainly used for high-precision measurement of surface roughness and waviness of irregular workpieces. With the cooperation of a five-axis displacement stage (XYZ displacement axes, swing rotary platform) and tooling fixture, and based on the provided workpiece model, it achieves rapid positioning. It can automatically adjust the displacement of the five-axis stage to the specified coordinate position input in the software, allowing the white light measuring head to quickly move to the specified coordinate position on the workpiece for measurement and data acquisition. Subsequently, the software analyzes the data to obtain 2D/3D data on roughness and waviness.
SuperView WX100 white light interferometry probe
Measurement Function: Enables high-precision Z-axis scanning of the sample surface to obtain 3D images. Analysis Function: Enables acquisition of 2D and 3D data regarding surface quality, such as roughness and micro-nano level profile dimensions. Programming Function: Supports pre-configured data processing and analysis tool steps, enabling one-click completion of the entire measurement and analysis process. Batch Analysis: Allows customization of data processing and analysis templates based on required parameters, enabling one-click batch analysis of data with the same type of parameters.
VT6000 series confocal microscope
The VT6000 series confocal microscope is a detection instrument used for micrometer and nanometer level measurement of various precision components and material surfaces. Based on confocal technology, combined with a precision Z-axis scanning module and 3D modeling algorithm, it performs non-contact scanning of the component surface and establishes a 3D surface image. The system software processes and analyzes the 3D image of the component surface and obtains 2D and 3D parameters that reflect the surface quality of the component, thus achieving optical detection of the 3D measurement of the component surface morphology. It can measure various object surfaces, from smooth to rough, low reflectivity to high reflectivity, roughness, flatness, microscopic geometric profile, curvature, etc., of workpieces from nanometer to micrometer levels, providing more than 300 2D and 3D parameters based on four domestic and international standards, including ISO/ASME/EUR/GBT, as evaluation standards.
VT6200 Series Long-Travel Confocal Microscope
The VT6000 series confocal microscope is a detection instrument used for micrometer and nanometer-level measurement of the surface of various precision components and materials. It uses confocal technology, combined with a precise Z-axis scanning module and 3D modeling algorithm, to perform non-contact scanning of the device surface and establish a 3D surface image. The system software processes and analyzes the 3D image of the device surface and obtains 2D and 3D parameters reflecting the surface quality of the device, thereby achieving optical detection of the 3D measurement of the device surface morphology. It can measure various surfaces, from smooth to rough, low reflectivity to high reflectivity, and the roughness, flatness, microscopic geometry profile, and curvature of workpieces from the nanometer to the micrometer level, providing more than 300 2D and 3D parameters based on four domestic and international standards, including ISO/ASME/EUR/GBT, as evaluation standards.
VT6300 series large stroke confocal microscope
The VT6000 series confocal microscope is a detection instrument used for micrometer and nanometer-level measurement of various precision components and material surfaces. Based on confocal technology, combined with a precision Z-axis scanning module and 3D modeling algorithm, it performs non-contact scanning of the device surface to establish a 3D surface image. The system software processes and analyzes the 3D image of the device surface, obtaining 2D and 3D parameters that reflect the surface quality of the device, thereby achieving optical detection of the 3D measurement of the device surface topography. It can measure various surfaces, ranging from smooth to rough, low reflectivity to high reflectivity, and roughness, flatness, micro-geometric profile, and curvature of workpieces from the nanometer to micrometer level, providing more than 300 2D and 3D parameters based on four domestic and international standards, including ISO/ASME/EUR/GBT, as evaluation standards.
MX 3200 Microscopic Dimension Measurement Instrument
The MX3200 Microscopic Dimension Measurement Instrument combines microscopic imaging with traditional image measurement, enabling the measurement of a wide range of tiny features. Equipped with an electric turret, it can automatically switch to different magnifications to detect various precision microscopic two-dimensional dimensional features. It offers rich dimensional measurement functions, enabling the measurement of various two-dimensional points, lines, circles, etc., and the evaluation of form and position tolerances. The MX3200 Microscopic Dimension Measurement Instrument can be used in the fields of precision machinery, optical communication devices, precision molds, magnetic materials, precision stamping, precision mobile phone components, medical devices, watches, tools, metrology and testing, etc.
Integrated Control Host Design A powerful CPU processing capability and compact control host are built into the laser tracking head. The integrated design of the host significantly reduces the number of connecting cables and carrying cases, facilitating quick on-site installation. Automatic Target Ball Locking Technology The target locking camera automatically searches for the target ball within a small range when the light is interrupted, automatically locking onto the target ball without any manual operation, thus improving measurement efficiency. HiADM Ranging Technology The fusion of laser absolute distance measurement (ADM) and laser interference distance measurement (IFM) technologies (HIADM) combines the high dynamic speed of laser interferometry with the functionality of laser absolute distance measurement, ensuring superior measurement accuracy and enabling light obstruction recovery. Integrated Meteorological Station The integrated environmental meteorological station automatically monitors and updates environmental meteorological parameters, providing real-time compensation for the effects of temperature, air pressure, and humidity on the refractive index of air for laser measurements, ensuring accuracy. MultiComm Communication The device can communicate with the computer via multiple methods such as hardware triggering, wired networks, or wireless WIFI, facilitating use in secure workshops and achieving a maximum measurement data output speed of 1000 points/second. Portable Transportation The laser tracking head with its integrated host design, and integrated accessory transport case, results in a small and lightweight overall transport system, making it easy to transport between different work locations. Sealed Protective Design IP54 protection rating ensures the host is protected from dust and other pollutants, offering strong environmental adaptability. Stable Tripod A stable and convenient tripod and chassis design ensure stable ground measurement conditions. The ingenious lifting mechanism is easy to operate, and the stable three-legged support system prevents accuracy loss due to environmental vibrations.
SJ6000 series laser interferometer
Laser interferometers use light waves as carriers. Their light wave wavelengths can be used to directly define meters and can be traced back to national standards. They are recognized as high-precision, high-sensitivity measuring instruments and are widely used in high-end manufacturing. The SJ6000 laser interferometer has the advantages of high measurement accuracy, large measurement range, fast measurement speed, and high resolution at the highest measurement speed. Combined with different optical lens groups, it can achieve high-precision measurement of linear length, angle, straightness, verticality, parallelism, flatness, and other geometric parameters. With the cooperation of the SJ6000 laser interferometer dynamic measurement software, dynamic measurement and performance testing of linearity, angle, and straightness can be realized, and displacement analysis, velocity analysis, acceleration analysis, and FFT analysis can be performed, such as dynamic characteristic analysis of screw rod guides, vibration analysis, and response characteristic analysis of drive systems.
Laser interferometers use light waves as carriers. Their light wave wavelengths can be used to directly define meters and can be traced back to national standards. They are recognized as high-precision, high-sensitivity measuring instruments and are widely used in high-end manufacturing. The SJ6000 laser interferometer has the advantages of high measurement accuracy, large measurement range, fast measurement speed, and high resolution at the highest measurement speed. Combined with different optical lens groups, it can achieve high-precision measurement of linear length, angle, straightness, verticality, parallelism, flatness, and other geometric parameters. With the cooperation of the SJ6000 laser interferometer dynamic measurement software, dynamic measurement and performance testing of linearity, angle, and straightness can be realized, and displacement analysis, velocity analysis, acceleration analysis, and FFT analysis can be performed, such as dynamic characteristic analysis of screw rod guides, vibration analysis, and response characteristic analysis of drive systems.