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Microscope

Scanning electron microscope Thermo Apreo 2 SEM


The Apreo 2 high-resolution field emission scanning electron microscope boasts superior low-voltage, low-beam current imaging capabilities. It comes standard with six detector types (T2, T2, T3, ETD, Nav-Cam, IR-CCD). A nanometer-scale response rate minimizes electron beam dwell time, and various intelligent scanning technologies minimize electron beam damage to the material. Optimized for the characterization and analysis of lithium battery materials, it enables high-precision analysis of the particle size, shape, and composition of micro- and nanostructures.

VT6000 series confocal microscope


The VT6000 series confocal microscope is a detection instrument used for micrometer and nanometer level measurement of various precision components and material surfaces. Based on confocal technology, combined with a precision Z-axis scanning module and 3D modeling algorithm, it performs non-contact scanning of the component surface and establishes a 3D surface image. The system software processes and analyzes the 3D image of the component surface and obtains 2D and 3D parameters that reflect the surface quality of the component, thus achieving optical detection of the 3D measurement of the component surface morphology. It can measure various object surfaces, from smooth to rough, low reflectivity to high reflectivity, roughness, flatness, microscopic geometric profile, curvature, etc., of workpieces from nanometer to micrometer levels, providing more than 300 2D and 3D parameters based on four domestic and international standards, including ISO/ASME/EUR/GBT, as evaluation standards.

VT6200 Series Long-Travel Confocal Microscope


The VT6000 series confocal microscope is a detection instrument used for micrometer and nanometer-level measurement of the surface of various precision components and materials. It uses confocal technology, combined with a precise Z-axis scanning module and 3D modeling algorithm, to perform non-contact scanning of the device surface and establish a 3D surface image. The system software processes and analyzes the 3D image of the device surface and obtains 2D and 3D parameters reflecting the surface quality of the device, thereby achieving optical detection of the 3D measurement of the device surface morphology. It can measure various surfaces, from smooth to rough, low reflectivity to high reflectivity, and the roughness, flatness, microscopic geometry profile, and curvature of workpieces from the nanometer to the micrometer level, providing more than 300 2D and 3D parameters based on four domestic and international standards, including ISO/ASME/EUR/GBT, as evaluation standards.

VT6300 series large stroke confocal microscope


The VT6000 series confocal microscope is a detection instrument used for micrometer and nanometer-level measurement of various precision components and material surfaces. Based on confocal technology, combined with a precision Z-axis scanning module and 3D modeling algorithm, it performs non-contact scanning of the device surface to establish a 3D surface image. The system software processes and analyzes the 3D image of the device surface, obtaining 2D and 3D parameters that reflect the surface quality of the device, thereby achieving optical detection of the 3D measurement of the device surface topography. It can measure various surfaces, ranging from smooth to rough, low reflectivity to high reflectivity, and roughness, flatness, micro-geometric profile, and curvature of workpieces from the nanometer to micrometer level, providing more than 300 2D and 3D parameters based on four domestic and international standards, including ISO/ASME/EUR/GBT, as evaluation standards.

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