MX 3200 Microscopic Dimension Measurement Instrument
The MX3200 Microscopic Dimension Measurement Instrument combines microscopic imaging with traditional image measurement, enabling the measurement of a wide range of tiny features. Equipped with an electric turret, it can automatically switch to different magnifications to detect various precision microscopic two-dimensional dimensional features. It offers rich dimensional measurement functions, enabling the measurement of various two-dimensional points, lines, circles, etc., and the evaluation of form and position tolerances. The MX3200 Microscopic Dimension Measurement Instrument can be used in the fields of precision machinery, optical communication devices, precision molds, magnetic materials, precision stamping, precision mobile phone components, medical devices, watches, tools, metrology and testing, etc.
Keywords:
Electronics and Electrical Engineering
Dimension measurement
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- Product Description
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- Commodity name: MX 3200 Microscopic Dimension Measurement Instrument
The MX3200 Microscopic Dimension Measurement Instrument combines microscopic imaging with traditional image measurement, enabling the measurement of a wide range of tiny features. Equipped with an electric turret, it can automatically switch to different magnifications to detect various precision microscopic two-dimensional dimensional features. It offers rich dimensional measurement functions, enabling the measurement of various two-dimensional points, lines, circles, etc., and the evaluation of form and position tolerances. The MX3200 Microscopic Dimension Measurement Instrument can be used in the fields of precision machinery, optical communication devices, precision molds, magnetic materials, precision stamping, precision mobile phone components, medical devices, watches, tools, metrology and testing, etc.
The MX3200 Microscopic Dimension Measuring Instrument combines microscopic imaging with traditional image measurement, enabling large-range measurement of tiny features. Equipped with an electric turret, it can automatically switch to different magnifications, detecting various precise two-dimensional microscopic features. It offers rich dimensional measurement functions, allowing for the measurement of various two-dimensional points, lines, circles, etc., and the evaluation of form and position tolerances.
The MX3200 Microscopic Dimension Measuring Instrument can be used in the fields of precision machinery, optical communication devices, precision molds, magnetic materials, precision stamping, mobile phone precision components, medical devices, clocks and watches, cutting tools, metrology and testing, etc.
Application Examples
Technical Specifications
Instrument Model
MX3200
Objective Lens
10×
20×
50×
Image Sensor
High-Definition Industrial Camera
Display
24-inch LCD display (XGA: 1920×1080)
Objective Turret
3-hole manual (5-hole electric optional)
Single Field of View Range
0.98×0.98mm
0.49×0.49mm
0.196×0.196mm
Lateral Resolution *1
2μm
1μm
0.4μm
Measurement*2 Accuracy
Single Field of View
±0.3μm
±0.2μm
±0.1μm
Motion Axis Ex/Ey
±(2.0+0.02 L)μm
Single Field of View Repeatability *3
±0.1μm
±0.1μm
±0.05μm
Height*4 Measurement
Measurement Accuracy
±(3.0+L/100)μm
Repeatability
±1μm
Travel Range
X
210mm
Y
110mm
Z
75mm
Grating Display Resolution
0.1μm
Illumination System
Surface Light
Coaxial Illumination
Profile Light
Telecentric Through Illumination (Green)
*5
Point Laser Measurement Accuracy
Maximum Hole Depth Ratio
1.5
Height Range
±3.5mm
Accuracy
±2.0μm
Measurement Software
VisionX
Maximum Measurement Speed
XY
80 mm/s
Z
25 mm/s
Dimensions (L×W×H)
531×455×761mm
Weight
74kg
Load Capacity
5kg
Operating Power
200-240VAC, 50/60Hz, 2A Power 300W
Operating Environment
Temperature 20℃+2℃, Humidity 20~80%, Vibration <0.002g, Below 15Hz
*1 At the focusing position, using the environmental temperature of +20±1.0℃, measure the standard line pair resolution board
*2 At the focusing position, using the environmental temperature of +20±1.0℃, measure the micro-nano standard board
*3 At the focusing position, using the environmental temperature of +20℃±1.0℃, measure the micro-nano standard board
*4 This is the Z-axis mechanical accuracy; the accuracy of lens focusing altimetry depends on the workpiece surface
*5 Optical height measurement sensor probe needs to be optional
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Mobile:+84 0384656346(Vietnam)
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