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JW-R03 Reflectivity Detector

The W-R03 Reflectivity Meter can measure the reflectance and reflectance curve of various objects, analyze the color characteristics of substances, and achieve rapid detection of full-spectrum reflectance. It meets various national standards. Using an integrating sphere measurement method, the measurement angle can be customized according to needs. The light source output has high stability and fast measurement speed, enabling real-time measurement operation.

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Electronics and Electrical Engineering

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The W-R03 Reflectivity Meter can measure the reflectance and reflectance curve of various objects, analyze the color characteristics of substances, and achieve rapid detection of full-spectrum reflectance. It meets various national standards. Using an integrating sphere measurement method, the measurement angle can be customized according to needs. The light source output has high stability and fast measurement speed, enabling real-time measurement operation.

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  • Product Description
    • Commodity name: JW-R03 Reflectivity Detector

    The W-R03 Reflectivity Meter can measure the reflectance and reflectance curve of various objects, analyze the color characteristics of substances, and achieve rapid detection of full-spectrum reflectance. It meets various national standards. Using an integrating sphere measurement method, the measurement angle can be customized according to needs. The light source output has high stability and fast measurement speed, enabling real-time measurement operation.

    Introduction:


    The JW-R03 Reflectivity Meter can measure the reflectance and reflectance curves of various objects, analyze the color characteristics of substances, and achieve rapid, simultaneous full-spectrum reflectance detection. It meets various national standards.

     

    Using an integrating sphere measurement method, the measurement angle can be customized according to needs. The light source output is highly stable and the measurement speed is fast, enabling real-time measurement operation.

    Features:
    ● Integrated measurement, intelligent operation
    ● Wide spectral detection 300-800nm
    ● Stable measurement data, high accuracy
    ● Equipped with an embedded computer, easy to operate
    ● Extremely fast measurement speed, data can be obtained in milliseconds
    ● Third-party authoritative certification, metrology certificates can be issued
    ● Independently developed, patented product
    ● Supports XY chromaticity diagrams, L*a*b determination, and can determine the color of objects based on spectrophotometry through spectral reflectance measurement
    ● Customizable industrial online automatic detection solutions
    ● Solutions can be customized according to specific needs
    ● Lifetime warranty

     

    Application Areas:
    ■ Reflectance detection of mobile phone covers, tablet back covers, etc.
    ■ Reflectance detection of lampshades, reflectors, car rearview mirrors, etc.
    ■ Reflectance spectrum measurement and color sorting of coatings, pigments, inks, plastics, etc.
    ■ Reflectance spectrum measurement of metal objects such as copper sheets
    ■ Reflectance spectrum measurement of ore powder
    ■ Reflectance measurement of opaque films
    ■ Reflectance detection of optical components
    ■ Reflectance detection of solar silicon wafers
    ■ Textile measurement
    ■ Identification of jewelry, jade, and diamonds
    ■ Reflectance detection of solid samples

     

    Reflectance measurement of iron ore powder

    Ink Measurement

    Reflectance measurement of copper sheet

     

     

     

     

     

     

     

     

     

     

     

    Silicon wafer reflectance measurement

    Textile Measurement

    Coating Measurement

     

     

     

     

     

     

     

     

     

     

     

    Technical Parameters:

    Model

    JW-R03

    Measurement Function

    Reflectance \ Reflectance spectral curve \ Color

    Illumination and Reception Conditions

    Reflection: 8 Diffuse illumination \ Vertical reception (integrating sphere method)

    Wavelength Range

    300-800nm

    Sample Port Size

    9mm ( Customizable according to needs)

    Measurement Range

    Reflectance: 0-100%

    Detector         

    2048 Array photoelectric detector

    Single Sampling Time

    Better than 1s

    Wavelength Accuracy     

    <1nm

    Wavelength Repeatability          

    0.2nm

    Display Accuracy    

    0.01%

    Instrument Repeatability              

    <1%

    Dark Background Subtraction                

    Automatic

    Minimum Measurable Sample Size

    Reflection: >9mm ( Customizable according to needs)

    Maximum Measurable Sample Size

    Reflection: Any size

    Measurable Parameters            

    Reflection: Wavelength reflectance, average reflectance, reflectance spectral curve,

    Reflectance vs. time curve, reflectance color XY XYZ Lab etc.

    Computer Operating System      

    USB Interface

    Supported Operating Systems             

    Windows 98/2000/XP/Vista/Windows 7/8/10

    Warranty

    3 Year

     

     


     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

    Advantage 1:

    Integrated reflectance device, with built-in display computer, can measure reflectance spectrum, simple and fast operation, and measurement spectral data is quickly displayed on the computer.

     

    Advantage 2:

    The light source output is stable and strong, with high measurement repeatability and accurate data.

     

    Advantage Three:

    This product is a patented product with authoritative certification, calibrated by a metrological institution, and a calibration certificate can be provided.

     

    Advantage Four:

    This product can also perform CIE color detection on samples, calculating various CIE color parameters such as x, y, L, a, b, dominant wavelength, etc.

     

     

    Advantage Five:
        The upper and lower limits of any wavelength range can be set for quality inspection. It quickly determines whether the product measurement results are OK or NG, automatically sorts out unqualified products, and statistically analyzes the product yield.
     

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