SPS5000 Semiconductor Parameter Test Software
The SPS5000 semiconductor parameter test software is designed to work with the IT2800 series of high-precision source/measure units, helping users quickly perform semiconductor device calibration, device electrical parameter testing, and device I-V characteristic testing. The SPS5000 software provides built-in models for MOSFETs, BJTs, diodes, and other two-terminal device structures, and offers ready-to-use test items for each type of device, such as breakdown voltage, on-resistance, and Id-Vd curve analysis. Testers can select a single test item for manual device verification or select multiple test items to build a test sequence for quick multi-parameter analysis of devices, according to their testing needs.
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- Commodity name: SPS5000 Semiconductor Parameter Test Software
The SPS5000 semiconductor parameter test software is designed to work with the IT2800 series of high-precision source/measure units, helping users quickly perform semiconductor device calibration, device electrical parameter testing, and device I-V characteristic testing. The SPS5000 software provides built-in models for MOSFETs, BJTs, diodes, and other two-terminal device structures, and offers ready-to-use test items for each type of device, such as breakdown voltage, on-resistance, and Id-Vd curve analysis. Testers can select a single test item for manual device verification or select multiple test items to build a test sequence for quick multi-parameter analysis of devices, according to their testing needs.
SPS5000 Semiconductor Parameter Test Software
The SPS5000 semiconductor parameter test software is used with the IT2800 series of high-precision source/measure units to help users quickly perform semiconductor device verification, device electrical parameter testing, and device I-V characteristic testing. The SPS5000 software provides built-in MOSFET, BJT, diode, and other two-terminal device structure models, and provides ready-to-use test items for each type of device, such as breakdown voltage, on-resistance, and Id-Vd curve analysis. Testers can select a single test item for manual device verification or select multiple test items to build a test sequence to quickly perform multi-parameter analysis of the device according to testing needs. SPS5000 also provides excellent data recording, curve plotting, and export analysis functions, making it professional testing software that helps users accelerate testing efficiency.
Product Features
♦ Intuitive graphical user interface design simplifies parameter configuration and I-V test analysis.
♦ Supports the entire characterization process from measurement setup and execution to result analysis and data management.
♦ Ready-to-use test items for MOSFET/BJT/Diode/Resistor, for quick access.
♦ Automated test sequence function for continuous execution of multiple parameter tests on devices.
♦ Automatically generates I-V curves and run result parameters to accelerate curve characteristic analysis.
♦ Multi-channel synchronous fast testing mode, supporting up to 32 CH devices for simultaneous online testing.
♦ Intuitive test reports save test data and charts to a database and can be exported to Excel.
♦ Powerful online chart analysis functions, supporting curve scaling, region marking, tangent lines, and other analysis tools.
♦ Can be used with the IT2800 series SMU, with a resolution of up to 100nV/10fA.Product Functions and Advantages
Ready-to-use test items accelerate device characterization testing.
The SPS5000 software has various powerful functions that allow for quick measurements and graphical results. To accelerate the semiconductor device verification testing process, SPS5000 provides various ready-to-use test items for common device types such as MOSFETs, diodes, BJTs, and thin-film resistors. Users do not need to develop any test items or code programming to quickly perform complex semiconductor tests. Taking the MOSFET Id-Vd output characteristic test as an example, the traditional testing process needs to go through: defining test variables --- developing test procedures --- writing test code --- executing the test. With the SPS5000 software, users only need three simple steps to quickly complete the test: the first step is to select the ready-to-use test item Id-Vd --- the second step is to configure the measurement conditions --- the third step is to execute the test.
Flexible test sequences improve testing efficiency.
The SPS5000 software provides a flexible and efficient method that allows users to select multiple test items to build test sequences for continuous testing of semiconductor device parameters, significantly shortening the test time. This function is suitable for test items with the same wiring method. When configuring a test, when you select one test item, the software automatically displays other test items with the same test wiring. You can select to execute a single test item (such as Id-Vd) or combine it into a test sequence for continuous testing (Id-Vd, Vth, IonIoffSlop) according to the specific test scenario and needs to achieve the evaluation and verification of semiconductor device performance.
Powerful online chart analysis functions.
The SPS5000 software provides powerful graphical display and analysis functions. Users can use the various chart analysis tools provided by the software, such as automatic curve scaling, constant lines, region marking, tangents, distribution lines, etc., to quickly complete the analysis of the test results. Users do not need to export charts and use other auxiliary tools, making it more convenient and faster. In addition, the software supports multi-Y-axis functions and allows users to flexibly configure the data types of the X-axis and Y-axis according to analysis needs, and select log or linear scale display formats to make the curve display more intuitive and in line with the analysis intent. As shown in the figure below, when you turn on the line function, the software will automatically display the parameter values at the intersection of the line and the curve.
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