ZEISS CONTURA three-coordinate measuring machine
The ZEISS CONTURA three-coordinate measuring machine allows you to prepare for tomorrow's measurement requirements today: The new generation of machines is equipped with a multi-application probe system (mass technology) and, thanks to a universal interface, allows for easy switching between different probe technologies in just a few simple steps. In addition to innovative options such as the use of a flexible rotary table, an automatic probe changing system or the HTG option (for a wider temperature range) for four-axis measurement, the device also represents outstanding performance, ergonomics and safety.
Keywords:
Three-coordinate
Electronics and Electrical Engineering
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隐藏域元素占位
- Product Description
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- Commodity name: ZEISS CONTURA three-coordinate measuring machine
The ZEISS CONTURA three-coordinate measuring machine allows you to prepare for tomorrow's measurement requirements today: The new generation of machines is equipped with a multi-application probe system (mass technology) and, thanks to a universal interface, allows for easy switching between different probe technologies in just a few simple steps. In addition to innovative options such as the use of a flexible rotary table, an automatic probe changing system or the HTG option (for a wider temperature range) for four-axis measurement, the device also represents outstanding performance, ergonomics and safety.
ZEISS CONTURA bridge-type CMM—a flexible, reliable, and high-quality assurance measurement platform from ZEISS. The latest generation of CMMs offers higher accuracy and compatibility with various optical probes, enabling a wider measurement range. Superior measurement technology, ZEISS CALYPSO measuring software, and highly optimized universal measuring programs make CONTURA a benchmark among its peers.
Probe Type
The CONTURA CMM can be equipped with passive fixed probes, flexible ZEISS RDS articulated probe heads, or active scanning probes. All probe types have scanning capabilities. Active probes utilize ZEISS navigator technology—high-speed measurement is readily available. The new generation ZEISS CONTURA can also be equipped with our confocal white light sensor, significantly improving performance in non-contact measurements.
Stable Measurement Results
Depending on the configuration, CONTURA uses industrial ceramic or CARAT guideways, offering excellent rigidity, low thermal expansion, and a lightweight body. All three axes use four-sided air-bearing supports to maintain stability during high-speed operation and acceleration. The glass-ceramic scales, suspended on the CONTURA guideways, have zero expansion characteristics, eliminating the need for temperature sensors or error compensation. The high level of protection allows the machine to be used in a production environment.
Computer-Aided Accuracy Correction (CAA)
Dynamic deformation of the bridge structure directly affects measurement accuracy, especially during scanning measurements. ZEISS CMMs can calculate the compensation values required for this dynamic effect. Therefore, measurement accuracy is guaranteed even in high-speed measurement environments.
Easy Control
Users can control the system via the user-friendly control panel without needing a computer. Advanced joysticks provide more convenient and precise control of all axis movements. Speed can be adjusted in CNC mode.
Options
. The HTG (wide temperature gradient) option ensures consistent accuracy within a wide temperature range (18-26°C). CMMs with X=700/1200mm include workpiece and CMM temperature sensors
. The integrated probe holder delivers maximum efficiency without calibration.
. Active stylus is suitable for quick-change rack options.
. The ZEISS AirSaver function can save up to 60% compressed air consumption.
Probe Type
Contact
Contact probes are suitable for measuring small workpieces with vertical surfaces and no bevel features. ZEISS CONTURA direkt is equipped with the ZEISS VAST XXT scanning probe, providing an economical entry-level scanning technology for single-direction production and process inspection. An XDT single-point probe can be added as needed. The maximum size of the ZEISS CONTURA contact probe is 9/18/8.
RDS
Used with the ZEISS VAST XXT probe and the flexible RDS articulated probe head to ensure scanning of angular features in complex positions. The RDS articulated probe head has a step angle of 2.5°, and the probe can reach 20,736 different angular positions. This advantage is particularly noticeable when measuring complex workpieces, where special probe configurations are needed. The calibration time is also significantly reduced due to the optimization of the calibration process. Optical probes can also be used on the ZEISS CONTURA with RDS.
Active
The ZEISS CONTURA bridge-type CMM active probe uses navigator technology, enabling the acquisition of required measurement values with a single, fast scan. Typical probes supporting this technology are the VAST XTR gold or VAST XT gold. Both probes have the same interface and are ideal for deep hole measurement. The probe quick-change system option is suitable for this probe system.
Measurement Range (in mm)
700 x 700 x 600
700 x 1000 x 600
1000 x 1200 x 600
1000 x 1600 x 600
900 x 1200 x 800
900 x 1600 x 800
1200 x 1800 x 1000
1200 x 2400 x 1000
Configurable Sensors
RDS Sensor Carrier
ViSCAN
LineScan
VAST XTR gold
VAST XXT
VAST XT gold
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