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Transmittance Detector

The transmittance detector can quickly and accurately measure the transmittance of various optical components such as planar, spherical, and aspherical surfaces. It can display real-time transmittance data at single or multiple wavelengths and average transmittance data within a specified band. It is suitable for detecting planar, spherical, aspherical optical components and combined lenses such as mobile phone cover plate IR holes, prisms, coated mirrors, cemented lenses, parallel plates, solar films, and optical filters.

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Electronics and Electrical Engineering

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The transmittance detector can quickly and accurately measure the transmittance of various optical components such as planar, spherical, and aspherical surfaces. It can display real-time transmittance data at single or multiple wavelengths and average transmittance data within a specified band. It is suitable for detecting planar, spherical, aspherical optical components and combined lenses such as mobile phone cover plate IR holes, prisms, coated mirrors, cemented lenses, parallel plates, solar films, and optical filters.

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  • Product Description
    • Commodity name: Transmittance Detector

    The transmittance detector can quickly and accurately measure the transmittance of various optical components such as planar, spherical, and aspherical surfaces. It can display real-time transmittance data at single or multiple wavelengths and average transmittance data within a specified band. It is suitable for detecting planar, spherical, aspherical optical components and combined lenses such as mobile phone cover plate IR holes, prisms, coated mirrors, cemented lenses, parallel plates, solar films, and optical filters.

    I. Product Overview

    The TS-3000Ⅱ is a single-surface reflectance measurement instrument for various optical components, including plane, spherical, and aspherical surfaces. After connecting the light source and computer, different tests are completed using the Biaoflag photoelectric spectroscopy analysis software.

     

    II. Technical Parameters

    Detector 

    Hamamatsu (Thin Back-illuminated FFT-CCD) 

    Detection Range 

    380-1100nm

    Signal-to-Noise Ratio 

    450:1 

    Wavelength Resolution 

    1nm

    Accuracy 

    0.3nm

    Detection Error 

    <0.5% 

    Single Measurement 

    <1

    Reproducibility (K9 Standard Plate) 

    ≤±0.1% (3σ)   (380nm-410nm), ≤±0.05% (3σ) (410nm-800nm) ≤±0.2%   (3σ)(800nm-1100nm) 

    Dimensions 

    300(W)×550(D)×570(H)mm 

    Weight 

    Approximately 15kg 

    Test Object N.A 

    0.4 (when using 20× objective lens), 0.3 (when using 10× objective lens) 

    Test Object Measurement Range 

    Approximately φ100μm (when using 10× objective lens), Approximately 50μm (when using 20× objective lens) 

    Focusing Method 

    Manual 

    Stage Size 

    200*200 mm 

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

     

    III. Product Structure and Principle

     

    IV. Usage Characteristics 
    · Video focusing, convenient operation and accurate data;
    · Small depth of field ensures good repeatability and small errors in measurement data;
    · Accurate digital camera video-assisted focusing

    · TS-3000 Ⅱ microscopically determines the reflectance of a tiny area: the objective lens focuses on a tiny area (φ60μm) of the measured object

    · Eliminates back reflections: Quickly and accurately determines surface reflectance without the need for back anti-reflection treatment.

     

    · Digital camera video autofocus: Finding the center point of the measured object is intuitive, convenient, fast, highly reproducible, and reduces errors caused by eye fatigue.


    · Millisecond-level detection time: High-performance detector, allowing for highly reproducible measurements within 1 second.

     

    · The SpecSetup spectral analysis software interface is simple and easy to understand, and the display/closing of each window can be set according to the test requirements.

     

    · SpecSetup can design various software interfaces to meet different testing needs.

     

    · CIE color determination: XY chromaticity diagram, XY Lab, saturation, dominant wavelength, etc., curve fitting coefficients can be obtained, and instrument-to-instrument errors can be eliminated.

    · Reports can be customized according to user requirements; an open database allows for the arbitrary addition of product data as required by the user.

    · Relative/absolute reflectance of various planar/spherical/aspherical components.

    · Rotating jig: Rotation at different angles (0-60°) can satisfy reflectance measurements at different positions of spherical samples.

     

    ·Precision micro-stage: travel ±5mm, accuracy 5μm; convenient and fast precise positioning of the center of micro-samples.

     

    V. Application Fields 
     

    Measurement of the relative/absolute reflectance of various plane/spherical/aspherical components. Suitable for measuring the coating reflectance of convex lenses, concave lenses, and lenses, CIE color measurement, film thickness and refractive index calculation, etc.

    Aspherical

    Spherical

    Planar

     

     

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