IT8700P Series Multi-Channel Input Programmable DC Electronic Load
The IT8700P series multi-channel input programmable DC electronic load is an improved and upgraded version of the IT8700. It inherits the original replaceable modular design, with up to 8 channels in a single chassis and up to 16 channels in an expansion chassis. Users can freely choose from 8 load modules according to their needs. It is also equipped with front/rear terminals, better meeting users' diverse testing needs.
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- Product Description
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- Commodity name: IT8700P Series Multi-Channel Input Programmable DC Electronic Load
The IT8700P series multi-channel input programmable DC electronic load is an improved and upgraded version of the IT8700. It inherits the original replaceable modular design, with up to 8 channels in a single chassis and up to 16 channels in an expansion chassis. Users can freely choose from 8 load modules according to their needs. It is also equipped with front/rear terminals, better meeting users' diverse testing needs.
IT8700P Series Multi-Input Programmable DC Electronic LoadThe IT8700P series multi-input programmable DC electronic load is an improved and upgraded version of the IT8700. It inherits the original replaceable modular design, with up to 8 channels in a single chassis and up to 16 channels in an expanded chassis. Users can freely choose from 8 load modules according to their needs. It is also equipped with front/rear terminals to better meet the diverse testing needs of users.
The IT8700P retains the adjustable slope and list load waveform editing functions of the IT8700, and adds current limit, PLC setting, and adjustable CV loop speed functions. Users can set automatic testing functions in the newly upgraded 7 operating modes for quick and accurate testing in R&D and production lines. At the same time, the IT8700P series has self-diagnostic overvoltage, overcurrent, overpower, and overtemperature protection functions to prevent damage to the instrument or personal injury caused by misoperation or environmental factors.Product Features♦ Replaceable modules, allowing for flexible configuration of the required test solutions;
♦ Dual-channel modules can simultaneously display data for each channel without switching
♦ Up to 8 channels in a single chassis, expandable to 16 channels;
♦ Dual-channel load modules have a dynamic power allocation function, significantly saving equipment costs
♦ Front/rear terminals are selectable
♦ Users can customize the module order (left/right)
♦ 8 operating modes: CC/CV/CR/CW/CV+CC/CR+CC/CW+CC/CV+CR(CR-LED)
♦ Adjustable CV loop speed, matching different power supplies
♦ High resolution and accuracy up to 0.1mV/0.1mA
♦ Measurement function for short-circuit peak current and peak voltage
♦ Voltage and current measurement speed up to 50kHz
♦ Adjustable current rise/fall slope
♦ Various load waveforms can be simulated in List mode
♦ Dynamic mode up to 25kHz, List mode setting speed up to 100kHz
♦ Automatic test function, automatically determines whether the test results exceed the set specifications
♦ Multiple electronic load modules can be synchronized for load testing
♦ OVP/OCP/OPP/OTP/Reverse polarity protection functions
♦ Built-in LAN/USB/RS232 communication interfacesProduct Functions and AdvantagesSelectable front/rear terminals, meeting diverse needs
The IT8700P is equipped with both front and rear terminals, allowing for connection and testing from either the front or rear panel to meet diverse user testing needs and avoid operational errors, improving testing efficiency. The IT8700P is only 4U high, making it more suitable for standard rack requirements and increasing system integration compatibility.
Eight Operating Modes
In addition to the basic CC/CV/CR/CW operating modes, the IT8700P series adds four composite operating modes: CV+CC/CR+CC/CW+CC/CV+CR(CR-LED). In CV/CR/CW steady-state operating modes, a CC current limit value (I-Limit) is added, which helps engineers effectively solve the problem of transient surge current in applications, avoiding protection triggering or damage to the device under test, and adapting to various test needs.
Freely Configurable Modular System Structure
The IT8700P series uses a replaceable modular design, allowing users to freely select modules as needed. Each load module and main control module unit has a high-performance microprocessor. They use a parallel architecture, resulting in high testing speed. The load modules are synchronously controlled by the system and can also synchronously test power supplies with multiple outputs.
Dynamic Power Allocation Mode
The dual-channel IT8700P series has a dynamic power allocation function, which can greatly save equipment costs in testing applications. Provided the total power does not exceed 300W and the single channel power does not exceed 250W, the power of the IT8700P series modules can be freely allocated to the two channels, rather than the traditional limited channel power allocation. Users can adjust the power ratio of the two load channels in the module according to the test requirements, achieving the best load power utilization. For example, when you need a 130W+170W or 50W+250W dual-channel load, the IT8700P series only needs a single module.
Combined with ITECH Test System
The IT8700 can be combined with ITECH power supplies, battery internal resistance testers, and temperature acquisition instruments to build the ITS5300 battery testing system, achieving simultaneous operation of hundreds of channels and real-time recording of voltage, current, and other waveforms. Test data can be exported to EXCEL.
The IT8700 can also be combined with ITECH AC/DC power supplies, relay cards, I/O cards, and DSO cards to build the ITS9500 power supply testing system, enabling simultaneous testing of multiple power supply modules or testing of multi-output AC/DC or DC/DC power supply modules.
The IT8700, combined with IT9380 software, can perform multi-channel testing of solar cells. Each channel test interface can be freely switched, supporting sample time setting and export of test data. With the IT8700's I-V sampling rate of up to 50kHz, efficient and fully automated testing of solar panels is achieved.
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